Trademark: 76317801
Status Date
Friday, February 28, 2003
Filing Date
Friday, September 28, 2001
Published for Opposition
Tuesday, June 4, 2002
Abandoned Date
Friday, February 28, 2003
9 Metrology instrument utilizing an optical technique for measuring microscopic features on samples, such as semiconductor wafers, flat panel displays and magnetic media
Jun 3, 2003
Abandonment - No Use Statement Filed
Aug 27, 2002
Noa Mailed - Sou Required From Applicant
Jun 4, 2002
Published For Opposition
May 15, 2002
Notice Of Publication
Mar 6, 2002
Approved For Pub - Principal Register
Mar 5, 2002
Assigned To Examiner
Jan 14, 2002
Correspondence Received In Law Office
Dec 17, 2001
Non-Final Action Mailed
Dec 12, 2001
Assigned To Examiner
Dec 10, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24