Trademark: 76317800
Status Date
Friday, January 17, 2014
Registration Number
2725536
Registration Date
Tuesday, June 10, 2003
Filing Date
Friday, September 28, 2001
Published for Opposition
Tuesday, September 24, 2002
Cancellation Date
Friday, January 17, 2014
9 OPTICAL METROLOGY INSTRUMENT USED TO MEASURE MICROSCOPIC FEATURES OF SAMPLES, PARTICULARLY, OF SEMICONDUCTOR WAFERS, FLAT PANEL DISPLAYS AND MAGNETIC MEDIA
Jan 17, 2014
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Nov 9, 2009
Attorney Revoked And/Or Appointed
Nov 9, 2009
Teas Revoke/Appoint Attorney Received
May 11, 2009
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
May 4, 2009
Assigned To Paralegal
Apr 30, 2009
Teas Section 8 & 15 Received
May 19, 2008
Case File In Ticrs
Jun 10, 2003
Registered-Principal Register
Apr 16, 2003
Allowed Principal Register - Sou Accepted
Apr 14, 2003
Assigned To Examiner
Apr 12, 2003
Statement Of Use Processing Complete
Jan 30, 2003
Use Amendment Filed
Jan 30, 2003
Paper Received
Dec 17, 2002
Noa Mailed - Sou Required From Applicant
Sep 24, 2002
Published For Opposition
Sep 4, 2002
Notice Of Publication
May 2, 2002
Approved For Pub - Principal Register
Apr 26, 2002
Assigned To Examiner
Apr 25, 2002
Examiners Amendment Mailed
Apr 1, 2002
Non-Final Action Mailed
Apr 1, 2002
Assigned To Examiner
Feb 11, 2002
Correspondence Received In Law Office
Jan 22, 2002
Non-Final Action Mailed
Dec 19, 2001
Assigned To Examiner
Dec 10, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
