Trademark: 76240663
Status Date
Saturday, May 16, 2009
Registration Number
2630776
Registration Date
Tuesday, October 8, 2002
Filing Date
Friday, April 13, 2001
Published for Opposition
Tuesday, July 16, 2002
Cancellation Date
Saturday, May 16, 2009
9 X-RAY DIFFRACTOMETER; WAFER MAPPING APPARATUS, NAMELY, APPARATUS TO DETERMINE THE COMPOSITION AND THICKNESS OF EPITAXIAL LAYERS
May 16, 2009
Cancelled Sec. 8 (6-Yr)
Oct 1, 2008
Automatic Update Of Assignment Of Ownership
Apr 3, 2008
Case File In Ticrs
Oct 8, 2002
Registered-Principal Register
Jul 22, 2002
Paper Received
Jul 16, 2002
Published For Opposition
Jun 26, 2002
Notice Of Publication
Apr 4, 2002
Approved For Pub - Principal Register
Jan 28, 2002
Correspondence Received In Law Office
Jan 30, 2002
Correspondence Received In Law Office
Jul 30, 2001
Non-Final Action Mailed
Jul 26, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24