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Trademark: 76240662
Status Date
Saturday, July 18, 2009
Registration Number
2658282
Registration Date
Tuesday, December 10, 2002
Filing Date
Friday, April 13, 2001
Published for Opposition
Tuesday, September 17, 2002
Cancellation Date
Saturday, July 18, 2009
9 X-RAY DIFFRACTOMETER; WAFER MAPPING APPARATUS, NAMELY, APPARATUS TO DETERMINE THE COMPOSITION AND THICKNESS OF EPITAXIAL LAYERS
Jul 18, 2009
Cancelled Sec. 8 (6-Yr)
Oct 1, 2008
Automatic Update Of Assignment Of Ownership
Mar 28, 2008
Case File In Ticrs
Dec 10, 2002
Registered-Principal Register
Sep 17, 2002
Published For Opposition
Aug 28, 2002
Notice Of Publication
Apr 30, 2002
Approved For Pub - Principal Register
Jan 29, 2002
Correspondence Received In Law Office
Jan 31, 2002
Correspondence Received In Law Office
Jul 30, 2001
Non-Final Action Mailed
Jul 26, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24