Trademark: 75703516
Status Date
Tuesday, November 27, 2001
Filing Date
Wednesday, May 12, 1999
Abandoned Date
Tuesday, November 27, 2001
9 semiconductor wafer gauge structures having know dimensional properties to be used in place of semiconductor wafers for the purpose of calibrating semiconductor wafer non-contact dimensional measurement devices
Nov 27, 2001
Abandonment - After Ex Parte Appeal
May 22, 2002
Assigned To Examiner
May 14, 2002
Exparte Appeal Terminated
Jan 2, 2002
Exparte Appeal Dsmsed - Failure To File Brief
Aug 21, 2001
Continuation Of Final Refusal Mailed
Aug 20, 2001
Assigned To Examiner
Apr 5, 2001
Jurisdiction Restored To Examining Attorney
Apr 5, 2001
Ex Parte Appeal-Instituted
Feb 5, 2001
Correspondence Received In Law Office
Aug 4, 2000
Final Refusal Mailed
Feb 17, 2000
Correspondence Received In Law Office
Aug 13, 1999
Non-Final Action Mailed
Jul 30, 1999
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24