Trademark: 75703515
Status Date
Friday, January 3, 2003
Filing Date
Wednesday, May 12, 1999
Published for Opposition
Tuesday, October 10, 2000
Abandoned Date
Friday, January 3, 2003
9 non-contact substrate surface dimension measurement hardware and associated data analysis software for processing substrate data, particularly semiconductor wafer data, for characterizing wafers based on their dimensional data
Aug 29, 2003
Abandonment - No Use Statement Filed
Jul 2, 2002
Extension 3 Granted
Jul 2, 2002
Extension 3 Filed
Jul 5, 2002
Paper Received
Jan 22, 2002
Extension 2 Granted
Dec 28, 2001
Extension 2 Filed
Jun 14, 2001
Extension 1 Granted
May 31, 2001
Extension 1 Filed
Jan 2, 2001
Noa Mailed - Sou Required From Applicant
Oct 10, 2000
Published For Opposition
Sep 8, 2000
Notice Of Publication
Jul 30, 2000
Approved For Pub - Principal Register
Feb 17, 2000
Correspondence Received In Law Office
Aug 12, 1999
Non-Final Action Mailed
Jul 30, 1999
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24