9 Scientific apparatus and instruments, namely, measurement gauges and scanners, thickness gauges and scanners, x-ray sensors or source, confocal laser measuring devices, laser shadow measurement devices, laser triangulation sensors, infra-red sensors, ultrasound sensors, online measurement and control systems, visual defect inspection systems, die bolt mapping devices, auto-die control, auto-profile control (APC), machine direction (MD) speed control; Gauges and scanners for measuring the basis weight and thickness profiles of planar materials; Systems for collecting and processing measured profile data for manual and automatic process control; Optical apparatus and instruments;, namely, scanners for detecting defects in planar materials; Systems for recording, tagging, storing, and displaying data and material defects; Weighing apparatus and instruments;, namely, gauges and scanners measuring thickness, basis weight, and density of planar materials; Measuring apparatus and instruments for use in the production of products by extrusion, coating, lamination processes;, namely, gauges, scanners and sensors for measuring thickness, basis weight, and density of planar materials; Checking apparatus and instruments, namely, gauges, scanners, and sensors for measuring thickness, basis weight, and density of planar materials; Image recording apparatus, namely, systems for recording images and data received by cameras and optical sensors; Image transmission apparatus, namely, cameras, fiber optic and digital image to signal conversion systems; Data processing equipment; scanners; Lasers not for medical purposes, for measuring and profiling the thickness of planar materials; Measuring sensors, namely, x-ray, laser, infrared, and ultrasonic sensors; Image reproduction apparatus, namely, x-ray, laser, infrared and ultrasonic measurement systems; visual inspection tools and instrumentation; Diagnostic apparatus other than for medical use, namely, x-ray, laser, infrared and ultrasonic gauges and scanners for measuring planar materials; Detectors, namely, x-ray, laser, infrared and ultrasonic gauges and scanners for measuring planar materials; Infrared detectors; gauges, namely, infrared sensors, gauges, scanners, for measuring planar materials; Downloadable software for analyzing and processing data related to x-ray, laser, infrared and ultrasonic gauges and scanners for measuring planar materials; X-ray producing apparatus and installations not for medical use, namely, gauges and scanners for measuring thickness, basis weight, density, and porosity of planar materials; X-Ray apparatus not for medical use, namely, gauges and scanners for measuring thickness, basis weight, density, and porosity of planar materials; Interfaces for computers, measurement gauges, scanners, and process control systems; Electric measuring apparatus; and Measurement and control systems for extrusion, coating, lamination processes