Trademark: 90856040
Status Date
Tuesday, October 24, 2023
Registration Number
7202665
Registration Date
Tuesday, October 24, 2023
Filing Date
Thursday, July 29, 2021
Published for Opposition
Tuesday, January 24, 2023
9 Metrology system, namely, deep ultraviolet laser scanner for detecting defects and particles created during the manufacture of semiconductor devices on wafers
Oct 24, 2023
Notice Of Registration Confirmation Emailed
Oct 24, 2023
Registered-Principal Register
Sep 20, 2023
Notice Of Acceptance Of Statement Of Use E-Mailed
Sep 19, 2023
Allowed Principal Register - Sou Accepted
Aug 11, 2023
Statement Of Use Processing Complete
Aug 1, 2023
Use Amendment Filed
Aug 11, 2023
Case Assigned To Intent To Use Paralegal
Aug 1, 2023
Teas Statement Of Use Received
Mar 21, 2023
Noa E-Mailed - Sou Required From Applicant
Jan 24, 2023
Official Gazette Publication Confirmation E-Mailed
Jan 24, 2023
Published For Opposition
Jan 4, 2023
Notification Of Notice Of Publication E-Mailed
Dec 17, 2022
Approved For Pub - Principal Register
Dec 7, 2022
Teas/Email Correspondence Entered
Dec 6, 2022
Correspondence Received In Law Office
Dec 6, 2022
Teas Response To Office Action Received
Jun 24, 2022
Notification Of Non-Final Action E-Mailed
Jun 24, 2022
Non-Final Action E-Mailed
Jun 24, 2022
Non-Final Action Written
May 3, 2022
Assigned To Examiner
Mar 31, 2022
Assigned To Examiner
Sep 27, 2021
New Application Office Supplied Data Entered
Aug 2, 2021
New Application Entered
Trademark Alertz updated from USPTO on 2030-01-24
