9 Analytical instruments and apparatus, namely confocal microscope, micro-Raman spectrograph or microscope, photoluminescence microscope, Fourier transform infrared microscope, spectroscopic ellipsometer, scanning probe microscope, atomic force microscope, photo induced force microscope, Kelvin probe microscope, scanning near-field optical microscope, the analyses occurring over a temperature range from 10mK to 1000K for research and characterization in laboratories and industrial manufacturing facilities, including the measurements of confocal microscopy, micro-Raman spectroscopy, photoluminescence microscopy, Fourier Transform Infrared Microscopy (FTIR), spectroscopic ellipsometry (SE), transport and microwave RF Measurements, scanning probe microscopies including its many modalities such as Atomic Force Microscopy, Photo induced Force Microscopy, Kelvin Probe Microscopy, scanning near-field optical microscopy, the analyses occurring over a temperature range from 10mK to 1000K
Trademark: 88576734
