9 Scientific equipment and components for vacuum systems for measuring thin film and films, namely, rate and thickness monitors, rate and thickness controllers, oscillators, electrical cables, piezoelectric sensors for measuring pressure and vibration and thickness of thin films, quartz crystal piezoelectric sensors for measuring pressure and vibration and thickness of thin films, metal alloy piezoelectric sensors for measuring pressure and vibration and thickness of thin films, vacuum sensor heads in the nature of thickness measuring instruments, feed throughs in the nature of thickness measuring instruments for thin film deposition and measuring, electron beam gun parts used in electron beam gun evaporation equipment in the nature material evaporation equipment for measuring thickness of or depositing of thin films, electron beam gun crucibles in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, evaporation boats used in electron beam gun evaporation equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, shims used in electron beam gun evaporation equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, crucible liners used in electron beam gun equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, crucible covers being used in electron beam gun equipment in the nature of material evaporation equipment for measuring thickness of or depositing of thin films, helium leak detectors for leak detection in vacuum systems. leak detector filaments being structural parts of leak detectors for vacuum systems, ultra-high vacuum chamber structural parts, pressure gauges, hot cathode filaments used for the production of electrons in the nature of cathodes for measurement of thickness during deposition of thin films, emitters in the nature of electron beam gun equipment for measuring thickness of or depositing of thin films, electromagnetic coils, gas distributors in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, cathode tips in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, keepers in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, anodes, ion source parts in the nature of ion beam source equipment used for measuring thickness during depositing of thin films, thermocouples, thermocouple controllers for pressure measurement, convection vacuum pressure measurement gauges, ionization gauge tubes in the nature of nude or glass hot cathode pressure gauges, replacement filaments in the nature of nude hot cathode pressure gauges, calibrated gauges for detecting helium leaks, and replacement filaments used in leak detectors and leak testing systems in the nature of cathodes for measurement of thickness during deposition of thin films; Sensors for measuring film, namely, piezoelectric sensors for measuring pressure and vibration
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