Trademark: 86465517
Status Date
Thursday, January 6, 2022
Registration Number
4776954
Registration Date
Tuesday, July 21, 2015
Filing Date
Wednesday, November 26, 2014
Published for Opposition
Tuesday, May 5, 2015
9 Scientific instruments in the nature of x-ray diffraction (XRD) analysis instruments with advanced software control that provide materials analysis measurements of thin film materials in such fields as semiconductor manufacturing and soil analysis
Jan 6, 2022
Registered - Sec. 8 (6-Yr) Accepted
Dec 15, 2021
Case Assigned To Post Registration Paralegal
Jul 21, 2021
Teas Section 8 Received
Oct 22, 2020
Notice Of Acceptance Of Sec. 8 - E-Mailed
Oct 22, 2020
Registered - Sec. 8 (6-Yr) Accepted
Oct 22, 2020
Case Assigned To Post Registration Paralegal
Jul 21, 2020
Teas Section 8 Received
Jul 21, 2020
Courtesy Reminder - Sec. 8 (6-Yr) E-Mailed
Jul 21, 2015
Registered-Principal Register
May 5, 2015
Official Gazette Publication Confirmation E-Mailed
May 5, 2015
Published For Opposition
Apr 15, 2015
Notification Of Notice Of Publication E-Mailed
Mar 16, 2015
Approved For Pub - Principal Register
Mar 16, 2015
Assigned To Examiner
Dec 5, 2014
Notice Of Pseudo Mark E-Mailed
Dec 4, 2014
New Application Office Supplied Data Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
