Trademark: 86292516
Word

Status
Dead
Status Code
606
Status Date
Monday, September 26, 2016
Serial Number
86292516
Mark Type
2000
Filing Date
Tuesday, May 27, 2014
Published for Opposition
Tuesday, June 30, 2015
Abandoned Date
Monday, September 26, 2016

Trademark Owner History
Tescan Orsay Holding a.s. - Owner At Publication

Classifications
9 Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely, electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron-beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for non-medical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments, namely, diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, microscope software that enhances the navigational and functional capability of microscopic, analytic, lithographic and spectroscopic components separately and in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and in integrated systems, namely, operating software for use in microscopic imaging, milling, deposition and analysis; image processing software
37 Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal ion sources, and plasma sources; installation, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and instruments for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; installation, maintenance and repair of electron-beam lithography apparatus; installation, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; installation, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; installation, maintenance and repair of lasers for non-medical purposes; installation, maintenance and repair of optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; installation, maintenance and repair of diaphragms for scientific apparatus; installation, maintenance and repair of measuring instruments, namely, micrometer gauges; installation, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, and cathodoluminiscence detectors; installation, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges
41 Arranging and conducting conferences, colloquiums, congresses, courses, seminars, symposiums, and workshops all for training purposes in the field of microscopy and nanotechnology, specifically in the subject areas of scanning and transmission electron microscopy, ion beam microscopy, ion beam processing techniques, and complex methods combining the forgoing microscopy with Raman microscopy, atomic force microscopy and lasers, and holographic microscopy
Color is not claimed as a feature of the mark.
The mark consists of a shaded rectangle with a circle in the middle with a partially shaded triangular shaped beam piercing the rectangle from the top right hand corner of the rectangle through the center of the rectangle and circle to just before the bottom left hand corner of the rectangle.

Trademark Events
Sep 26, 2016
Abandonment Notice Mailed - No Use Statement Filed
Sep 26, 2016
Abandonment - No Use Statement Filed
Feb 25, 2016
Notice Of Approval Of Extension Request E-Mailed
Feb 23, 2016
Extension 1 Granted
Feb 23, 2016
Extension 1 Filed
Feb 23, 2016
Teas Extension Received
Aug 25, 2015
Noa E-Mailed - Sou Required From Applicant
Jun 30, 2015
Official Gazette Publication Confirmation E-Mailed
Jun 30, 2015
Published For Opposition
Jun 10, 2015
Notification Of Notice Of Publication E-Mailed
Apr 28, 2015
Withdrawn From Pub - Og Review Query
Apr 10, 2015
Law Office Publication Review Completed
Apr 9, 2015
Approved For Pub - Principal Register
Apr 9, 2015
Examiner's Amendment Entered
Apr 9, 2015
Notification Of Examiners Amendment E-Mailed
Apr 9, 2015
Examiners Amendment E-Mailed
Apr 9, 2015
Examiners Amendment -Written
Mar 27, 2015
Teas/Email Correspondence Entered
Mar 27, 2015
Correspondence Received In Law Office
Mar 20, 2015
Assigned To Lie
Mar 12, 2015
Teas Response To Office Action Received
Sep 12, 2014
Notification Of Non-Final Action E-Mailed
Sep 12, 2014
Non-Final Action E-Mailed
Sep 12, 2014
Non-Final Action Written
Sep 9, 2014
Assigned To Examiner
Aug 13, 2014
Teas Amendment Entered Before Attorney Assigned
Aug 13, 2014
Teas Voluntary Amendment Received
Jun 10, 2014
Notice Of Design Search Code E-Mailed
Jun 9, 2014
New Application Office Supplied Data Entered In Tram
May 30, 2014
New Application Entered In Tram

Trademark Alertz updated from USPTO on 2030-01-24