Trademark: 85244594
Status Date
Wednesday, February 20, 2013
Filing Date
Thursday, February 17, 2011
Published for Opposition
Tuesday, December 13, 2011
Abandoned Date
Wednesday, February 20, 2013
9 Optical inspection apparatus for inspection and measurement of semiconductor wafers and similar substrates in various stages of processing comprised of a control computer, software, automatic recipe controlled sample handling, monochromatic illumination sources, light sensors, cameras, optical filters, and monochrometers and spectrometers
Feb 20, 2013
Abandonment Notice Mailed - Inter Partes Decision
Feb 20, 2013
Abandonment - After Inter Partes Decision
Feb 20, 2013
Opposition Terminated No. 999999
Feb 20, 2013
Opposition Sustained No. 999999
Jun 11, 2012
Opposition Instituted No. 999999
Jan 10, 2012
Extension Of Time To Oppose Received
Dec 13, 2011
Official Gazette Publication Confirmation E-Mailed
Dec 13, 2011
Published For Opposition
Nov 23, 2011
Notification Of Notice Of Publication E-Mailed
Nov 4, 2011
Law Office Publication Review Completed
Nov 4, 2011
Assigned To Lie
Oct 11, 2011
Approved For Pub - Principal Register
Oct 10, 2011
Teas/Email Correspondence Entered
Oct 10, 2011
Correspondence Received In Law Office
Oct 10, 2011
Teas Response To Office Action Received
May 20, 2011
Notification Of Non-Final Action E-Mailed
May 20, 2011
Non-Final Action E-Mailed
May 20, 2011
Non-Final Action Written
May 19, 2011
Assigned To Examiner
Feb 22, 2011
New Application Office Supplied Data Entered In Tram
Feb 21, 2011
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
