Trademark: 79399904
Word
WAFER METROLOGY CENTER
Status Date
Thursday, July 11, 2024
Filing Date
Tuesday, June 4, 2024
9 Electro-optical instruments for use in inspection and measurement of industrial components such as silicon wafers.
Jul 18, 2024
Limitation From Original Application Entered
Jul 11, 2024
Sn Assigned For Sect 66a Subseq Desig From Ib
Jul 24, 2024
New Application Office Supplied Data Entered
Jul 24, 2024
Application Filing Receipt Mailed
Trademark Alertz updated from USPTO on 2030-01-24