9 Apparatus for inspecting semiconductor materials including wafers; apparatus for inspecting photovoltaic cells, photovoltaic devices and photovoltaic modules; apparatus for inspecting bulk silicon, silicon wafers and silicon devices; apparatus for testing semiconductor materials and semiconductor devices including photovoltaic devices; apparatus for inspecting semiconductor materials and photovoltaic devices using luminescence imaging; diagnostic apparatus, not for medical purposes; apparatus for diagnosis of defects in semiconductor wafers, photovoltaic cells, photovoltaic devices and photovoltaic modules; software for processing images of semiconductor materials including wafers; software for processing images of photovoltaic cells, photovoltaic devices and photovoltaic modules; software for automating the acquisition and analysis of photoluminescence and electroluminescence images; software for automating the analysis of photoluminescence and electroluminescence images using machine learning; software for integrating apparatus for inspecting semiconductor materials into fully automated production lines according to automated metrology and optimisation of semiconductor manufacturing lines.
Trademark: 79399868
