Trademark: 79386765
Word
SEMILAB
Status
Pending
Status Code
641
Status Date
Monday, January 29, 2024
Serial Number
79386765
Mark Type
3000
Filing Date
Thursday, February 16, 2023

Trademark Owner History

Classifications
9 Optical and electrical measuring devices for the inspection of semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures, for determining their physical and chemical properties, namely, layer thickness, hardness, dopant and/or contaminant concentration and electrical conductivity, and for detecting surface irregularities, crystal defects and manufacturing defects, and components of said optical and electrical measuring devices; software for controlling measuring devices, evaluating the measurement results, performing related simulations and controlling manufacturing processes
16 Documentation, user manuals and technical data sheets of measuring devices used in the semiconductor industry and related areas and of the software related to said measuring devices; teaching materials, printed protocols, brochures and publications relating to said measuring devices and related software
37 Servicing and maintenance of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures
42 Carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design and development of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; quality control and authentication services related to devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design, development and testing of software for controlling measuring devices, evaluating the produced measurement results, performing related simulations and controlling manufacturing processes

Trademark Events
Feb 19, 2024
Refusal Processed By Ib
Jan 29, 2024
Non-Final Action Mailed - Refusal Sent To Ib
Jan 29, 2024
Refusal Processed By Mpu
Jan 12, 2024
Non-Final Action (Ib Refusal) Prepared For Review
Jan 11, 2024
Non-Final Action Written
Jan 9, 2024
Application Filing Receipt Mailed
Jan 5, 2024
Assigned To Examiner
Jan 5, 2024
New Application Office Supplied Data Entered
Jan 4, 2024
Sn Assigned For Sect 66a Appl From Ib

Trademark Alertz updated from USPTO on 2030-01-24