Trademark: 79269499
Status Date
Tuesday, March 17, 2020
Registration Number
6010542
Registration Date
Tuesday, March 17, 2020
Filing Date
Tuesday, August 13, 2019
Published for Opposition
Tuesday, December 31, 2019
RIBER -
Original Registrant
9 Instruments for measuring the curvature of a substrate on which a thin film is deposited or on which a vacuum treatment is carried out by a physical or chemical process, the substrate in question being a wafer of a metallic or semiconductor element, these instruments being used for in situ monitoring of the growth of the thin film in real time
May 15, 2020
Notification Processed By Ib
Apr 28, 2020
Final Disposition Notice Sent To Ib
Apr 28, 2020
Final Disposition Processed
Apr 16, 2020
Grant Of Protection Created, To Be Sent To Ib
Mar 17, 2020
Registered-Principal Register
Jan 4, 2020
Notification Processed By Ib
Dec 31, 2019
Published For Opposition
Dec 18, 2019
Notification Of Possible Opposition Sent To Ib
Dec 18, 2019
Notice Of Start Of Opposition Period Created, To Be Sent To Ib
Dec 11, 2019
Notice Of Publication
Nov 25, 2019
Approved For Pub - Principal Register
Nov 12, 2019
Assigned To Examiner
Oct 22, 2019
Application Filing Receipt Mailed
Oct 18, 2019
New Application Office Supplied Data Entered In Tram
Oct 17, 2019
Sn Assigned For Sect 66a Appl From Ib
Trademark Alertz updated from USPTO on 2030-01-24
