Trademark: 79189104
Word
ENVIRO
Status
Registered
Status Code
706
Status Date
Thursday, October 5, 2023
Serial Number
79189104
Registration Number
5158483
Registration Date
Tuesday, March 14, 2017
Mark Type
3
Filing Date
Friday, March 18, 2016
Published for Opposition
Tuesday, December 27, 2016

Trademark Owner History
SPECS Surface Nano Analysis GmbH - Original Registrant

Classifications
41 EDUCATIONAL SERVICES, NAMELY, CLASSES IN THE FIELD OF HANDLING AND OPERATING SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS; EDUCATIONAL SERVICES, NAMELY, ARRANGING AND CONDUCTING SEMINARS AND WORKSHOPS IN THE FIELD OF HANDLING AND OPERATING SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS, FOR EDUCATIONAL PURPOSES; TRAINING ADVICE IN THE FIELD OF HANDLING AND OPERATING SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR ELECTRON SPECTROMETERS
9 SCIENTIFIC APPARATUS AND INSTRUMENTS, namely, SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS; [ MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; ] * MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; * EXCITATION SOURCES, IN PARTICULAR ELECTRON TUBES, LASERS FOR NON-MEDICAL PURPOSES, PULSE GENERATORS FOR TESTING ELECTRIC CURRENT, OPTICAL LAMPS AND LED LIGHT EMITTING DIODES, WITH ULTRAVIOLET LIGHT, X-RAYS AND ELECTRONS FOR USE IN SCIENTIFIC APPARATUS AND INSTRUMENTS; [ ACCESSORIES FOR SCIENTIFIC APPARATUS AND INSTRUMENTS AND FOR MEASURING APPARATUS AND INSTRUMENTS, namely, DEPTH GAUGES FOR SCANNING PROBE MICROSCOPES; ] PROBES AND SENSORS FOR USE WITH ELECTRON SPECTROSCOPY AND GAS ANALYSIS AND FOR MEASURING APPARATUS AND INSTRUMENTS FOR SCIENTIFIC PURPOSES; DATA PROCESSING APPARATUS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; COMPUTER SOFTWARE FOR DATABASE MANAGEMENT; COMPUTER PROGRAMS FOR THE TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA, AND COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS * ; [ ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, IN PARTICULAR FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS, IN PARTICULAR SPECTROSCOPES FOR ELECTRON SPECTROSCOPY, ION SPECTROSCOPY AND GAS AND ELEMENTAL ANALYSIS ] * ELECTRIC AND ELECTRONIC CONTROL APPARATUS AND INSTRUMENTS, namely, FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS *
42 [ SCIENTIFIC AND TECHNOLOGICAL SERVICES, NAMELY, RESEARCH AND DESIGN RELATED TO THE ANALYSIS OF SURFACES IN RELATION TO THE DESIGN, ASSEMBLY AND OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYSIS WHICH USE METHODS FOR SPECTROSCOPY AND MICROSCOPY BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF SEMICONDUCTOR PROCESSING TECHNOLOGY; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES IN THE FIELD OF SURFACES OF MATERIALS; ] * SCIENTIFIC AND TECHNOLOGICAL SERVICES AND RESEARCH AND RELATED DESIGN SERVICES RELATED TO THE ANALYSIS OF SURFACES, EACH SERVICES IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS; RESEARCH IN THE FIELD OF TECHNOLOGY FOR ANALYZING SURFACES; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES RELATING TO MATERIAL SURFACES * DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE, IN PARTICULAR DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA AND COMPUTER PROGRAMS FOR CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; UPDATING COMPUTER SOFTWARE, IN PARTICULAR UPDATING COMPUTER SOFTWARE FOR TRANSMISSION, PROCESSING, EDITING AND ANALYSIS OF DATA * WHEN ANALYZING SURFACES * AND UPDATING OF COMPUTER PROGRAMS FOR THE CONTROL OF SCIENTIFIC APPARATUS AND INSTRUMENTS * FOR ANALYZING SURFACES * ; ENGINEERING AND PHYSICS RESEARCH * FOR ANALYZING SURFACES * ; ENGINEERING SERVICES, PARTICULARLY TECHNICAL PROJECT PLANNING [ AND DESIGN ENGINEERING FOR THE PROCESSING OF WEB PRODUCTS] * IN CONNECTION WITH THE DESIGN, THE INSTALLATION AND THE OPERATION OF MEASURING APPARATUS AND INSTRUMENTS FOR MATERIAL ANALYTICS USING SPECTROSCOPIC AND MICROSCOPIC METHODS BEING BASED ON ELECTRONS, IONS AND PHOTONS *
The mark consists of the wording "ENVIRO" in dark blue block lettering with a design element composed of 3 stylized leaves to the upper right of the letter "E". One leaf is entirely dark blue, the leaf to its right is light green and dark green and the leaf directly below the dark blue leaf is medium blue and light blue.
In the Statement, Page 1, lines 7-10, "measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons;" should be deleted, and, "measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 20, after APPARATUS, "apparatus for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons;" should be inserted, and, In the Statement, Page 1, line 23, after, INSTRUMENTS, "for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 23-27, " electric and electronic control apparatus and instruments, in particular for the control of scientific apparatus and instruments, in particular spectroscopes for electron spectroscopy, ion spectroscopy and gas and elemental analysis " should be deleted, and, "electric and electronic control apparatus and instruments, namely for the control of scientific apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted, and, In the Statement, Page 1, lines 37- Page 2, line 2, "Scientific and technological services, namely, research and design related to the analysis of surfaces in relation to the design, assembly and operation of measuring apparatus and instruments for material analysis which use methods for spectroscopy and microscopy based on electrons, ions and photons; research in the field of semiconductor processing technology; industrial analysis and research services in the field of surfaces of materials; " should be deleted, and, "Scientific and technological services and research and related design services related to the analysis of surfaces, each services in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons; research in the field of technology for analyzing surfaces; industrial analysis and research services relating to material surfaces;" should be inserted, and, In the Statement, Page 2, line 7 and line 10, after INSTRUMENTS, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 8, after DATA, "when analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 11, after RESEARCH, "for analyzing surfaces" should be inserted, and, In the Statement, Page 2, line 12 and 13,"and design engineering for the processing of web products" should be deleted, and, "in connection with the design, the installation and the operation of measuring apparatus and instruments for material analytics using spectroscopic and microscopic methods being based on electrons, ions and photons" should be inserted.
The color(s) dark blue, medium blue, light blue, light green and dark green is/are claimed as a feature of the mark.

Trademark Events
Jul 14, 2016
Sn Assigned For Sect 66a Appl From Ib
Jul 15, 2016
New Application Office Supplied Data Entered
Jul 15, 2016
Assigned To Examiner
Jul 19, 2016
Application Filing Receipt Mailed
Jul 25, 2016
Non-Final Action Written
Jul 26, 2016
Non-Final Action (Ib Refusal) Prepared For Review
Jul 26, 2016
Refusal Processed By Mpu
Jul 26, 2016
Non-Final Action Mailed - Refusal Sent To Ib
Aug 12, 2016
Refusal Processed By Ib
Nov 11, 2016
Teas Response To Office Action Received
Nov 11, 2016
Correspondence Received In Law Office
Nov 11, 2016
Teas Revoke/App/Change Addr Of Atty/Dom Rep Received
Nov 11, 2016
Attorney/Dom.Rep.Revoked And/Or Appointed
Nov 12, 2016
Teas/Email Correspondence Entered
Nov 20, 2016
Approved For Pub - Principal Register
Dec 7, 2016
Notice Of Publication
Dec 27, 2016
Published For Opposition
Mar 14, 2017
Registered-Principal Register
May 19, 2017
Limitation Of Goods Received From Ib
Jun 14, 2017
Final Disposition Notice Created, To Be Sent To Ib
Jul 5, 2017
Correction Under Section 7 - Processed
Jul 5, 2017
Final Disposition Processed
Jul 5, 2017
Limitation From The Ib Examined And Entered
Jul 5, 2017
Final Disposition Notice Sent To Ib
Jul 21, 2017
Final Decision Transaction Processed By Ib
Mar 5, 2018
Partial Invalidation Of Reg Ext Protection Created
Mar 15, 2018
Invalidation Reviewed - No Action Required By Office
Nov 6, 2021
New Representative At Ib Received
Mar 10, 2023
Teas Section 71 Received
Oct 2, 2023
Case Assigned To Post Registration Paralegal
Oct 5, 2023
Registered-Sec.71 Accepted
Oct 5, 2023
Notice Of Acceptance Of Sec. 71 - E-Mailed
Nov 19, 2023
New Representative At Ib Received
Dec 20, 2023
Teas Change Of Domestic Representatives Address
Dec 20, 2023
Teas Change Of Correspondence Received
Dec 20, 2023
Teas Revoke/App/Change Addr Of Atty/Dom Rep Received
Dec 20, 2023
Attorney/Dom.Rep.Revoked And/Or Appointed
Jun 14, 2024
Partial Invalidation Of Reg Ext Protection Created

Trademark Alertz updated from USPTO on 2030-01-24