Trademark: 79031217
Status Date
Friday, August 5, 2016
Filing Date
Saturday, August 5, 2006
Abandoned Date
Friday, August 5, 2016
9 Optical measuring devices, in particular measuring devices for examining electronic components, such as semiconductor wafers, optical defect inspection devices for the detection of particles, micro-surface roughness and surface defects, optical layer thickness measuring devices for the layer thickness measurement of transparent layers, such as laser ellipsometers; combined optical measuring devices, in particular combined defect inspection devices and layer thickness measuring devices
Mar 11, 2017
Notification Of Effect Of Cancellation Of Intl Reg Mailed
Mar 10, 2017
Death Of International Registration
Oct 3, 2008
Final Decision Transaction Processed By Ib
Aug 28, 2008
Final Disposition Notice Sent To Ib
Aug 28, 2008
Final Disposition Notice Created, To Be Sent To Ib
May 22, 2008
Notification Of Possible Opposition - Processed By Ib
May 8, 2008
Notification Of Possible Opposition Sent To Ib
May 8, 2008
Notification Of Possible Opposition Created, To Be Sent To Ib
Aug 28, 2007
Abandonment Notice Mailed - Failure To Respond
Aug 28, 2007
Abandonment - Failure To Respond Or Late Response
Feb 1, 2007
Refusal Processed By Ib
Jan 11, 2007
Non-Final Action Mailed - Refusal Sent To Ib
Jan 11, 2007
Refusal Processed By Mpu
Dec 31, 2006
Non-Final Action (Ib Refusal) Prepared For Review
Dec 30, 2006
Non-Final Action Written
Dec 29, 2006
Assigned To Examiner
Dec 8, 2006
New Application Entered In Tram
Dec 7, 2006
Sn Assigned For Sect 66a Appl From Ib
Trademark Alertz updated from USPTO on 2030-01-24
