Trademark: 78930287
Status Date
Wednesday, July 30, 2008
Filing Date
Friday, July 14, 2006
Published for Opposition
Tuesday, November 6, 2007
Abandoned Date
Wednesday, July 30, 2008
9 Test probe electrical contacts and holders therefor and test probe high current large electrical contacts and holders therefore, for probing integrated circuits, and semiconductor devices; electrical testing equipment, namely, probe cards, and probe card interfaces to facilitate testing of integrated circuits
Sep 30, 2008
Abandonment Notice Mailed - No Use Statement Filed
Sep 30, 2008
Abandonment - No Use Statement Filed
Jan 29, 2008
Noa Mailed - Sou Required From Applicant
Nov 6, 2007
Published For Opposition
Oct 17, 2007
Notice Of Publication
Sep 30, 2007
Law Office Publication Review Completed
Sep 30, 2007
Assigned To Lie
Aug 29, 2007
Approved For Pub - Principal Register
Aug 29, 2007
Examiner's Amendment Entered
Aug 29, 2007
Notification Of Examiners Amendment E-Mailed
Aug 29, 2007
Examiners Amendment E-Mailed
Aug 29, 2007
Examiners Amendment -Written
Jan 8, 2007
Non-Final Action E-Mailed
Jan 8, 2007
Non-Final Action Written
Dec 6, 2006
Assigned To Examiner
Jul 21, 2006
Notice Of Pseudo Mark Mailed
Jul 20, 2006
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
