Trademark: 78641626
Word
FEI COMPANY TOOLS FOR NANOTECH
Status Date
Friday, December 26, 2014
Registration Number
3431150
Registration Date
Tuesday, May 20, 2008
Filing Date
Wednesday, June 1, 2005
Published for Opposition
Tuesday, March 4, 2008
Cancellation Date
Friday, December 26, 2014
7 Components of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, high brightness, sub-micron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, imaging, and ion beam milling, secondary ion mass spectrometry, focused electron beam columns for electron beam lithography, and electron beam microscopy and analysis, ion beam source emitters, electron beam source emitters; accessories of equipment and micro-machining equipment for the manufacture of semi-conductors, data storage components, and items for scientific research use, namely, sample preparation equipment that prepares biological samples for examination by microscopes
9 Focused ion beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; Microscopes, scanning electron microscopes, scanning ion microscopes, atomic-force microscopes, and transmission electron microscopes; Microscopic system navigational software, namely, software that visually enhances the navigational, functional capability of spectroscopic, lithographic, and microscopic components; Application software and operation system software for operation of all the foregoing equipment, namely, software for use in microscopic imaging, milling and analysis; Computer software for manufacturing semi-conductors; Computer software for manufacturing data storage components; and computer software for manufacturing micro-machinery
37 Repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes; post-warranty repair and maintenance of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
41 Training in the operation of components of equipment and micro-machining equipment and accessories for the manufacture of semi-conductors and data storage components, microscopes, scanning electron microscopes, scanning ion microscopes, focused ion beam tools, secondary ion mass spectrometry systems, atomic-force microscopes, and transmission electron microscopes
42 Scientific analysis and high resolution imaging, namely, scanning electron and focused ion beam microscopy, in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological sciences and manufacture of devices with sub-micron features; Computer software support services, namely, trouble shooting of computer software problems, providing back up for computer software programs; Computer software consultation services; design and updating of computer software; project management relating to computer software; Computer software installation and maintenance; Providing information and advice relating to computer software
Color is not claimed as a feature of the mark.
"COMPANY TOOLS FOR NANOTECH"
Dec 26, 2014
Cancelled Sec. 8 (6-Yr)
May 20, 2008
Registered-Principal Register
Mar 4, 2008
Published For Opposition
Feb 13, 2008
Notice Of Publication
Jan 31, 2008
Law Office Publication Review Completed
Jan 11, 2008
Approved For Pub - Principal Register
Jan 11, 2008
Examiner's Amendment Entered
Jan 11, 2008
Notification Of Examiners Amendment E-Mailed
Jan 11, 2008
Examiners Amendment E-Mailed
Jan 11, 2008
Examiners Amendment -Written
Jan 10, 2008
Assigned To Examiner
Jan 10, 2008
Previous Allowance Count Withdrawn
Jan 10, 2008
Assigned To Examiner
Jan 7, 2008
Assigned To Examiner
Aug 6, 2007
Withdrawn From Pub - Og Review Query
May 23, 2007
Law Office Publication Review Completed
May 20, 2007
Approved For Pub - Principal Register
May 20, 2007
Examiner's Amendment Entered
May 20, 2007
Examiners Amendment E-Mailed
May 20, 2007
Examiners Amendment -Written
May 16, 2007
Previous Allowance Count Withdrawn
Mar 26, 2007
Withdrawn From Pub - Og Review Query
Mar 1, 2007
Law Office Publication Review Completed
Feb 17, 2007
Approved For Pub - Principal Register
Feb 16, 2007
Examiner's Amendment Entered
Feb 16, 2007
Assigned To Lie
Feb 15, 2007
Examiners Amendment E-Mailed
Feb 15, 2007
Examiners Amendment -Written
Aug 15, 2006
Final Refusal E-Mailed
Aug 15, 2006
Final Refusal Written
Jul 27, 2006
Amendment From Applicant Entered
Jul 3, 2006
Correspondence Received In Law Office
Jul 3, 2006
Paper Received
Jan 5, 2006
Non-Final Action E-Mailed
Jan 5, 2006
Non-Final Action Written
Dec 21, 2005
Assigned To Examiner
Jun 8, 2005
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
