Trademark: 78320394
Word
CRITICAL SHAPE METROLOGY
Status Date
Sunday, January 9, 2005
Filing Date
Wednesday, October 29, 2003
Abandoned Date
Thursday, December 2, 2004
9 Computer software for metrology systems using a scanning electron microscope to measure features of semiconductor devices in connection with fabrication of semiconductor wafers
Jan 10, 2005
Abandonment Notice Mailed - Failure To Respond
Jan 9, 2005
Abandonment - Failure To Respond Or Late Response
Jun 1, 2004
Non-Final Action Mailed
May 16, 2004
Assigned To Examiner
Nov 21, 2003
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24