Trademark: 78272191
Status Date
Friday, September 28, 2012
Registration Number
3044330
Registration Date
Tuesday, January 17, 2006
Filing Date
Wednesday, July 9, 2003
Published for Opposition
Tuesday, January 18, 2005
Cancellation Date
Friday, September 28, 2012
9 Metrology systems for the semiconductor industry comprising automated critical dimension scanning electron microscopes, and optical critical dimension scanning electron microscopes, used in the measurement, development, fabrication and manufacture of state of the art integrated circuits and semiconductor devices
37 Services in the semiconductor industry, namely, installation, maintenance of metrology systems
Sep 28, 2012
Cancelled Sec. 8 (6-Yr)
Jan 17, 2006
Registered-Principal Register
Nov 22, 2005
Opposition Terminated No. 999999
Nov 22, 2005
Opposition Dismissed No. 999999
Jul 22, 2005
Opposition Instituted No. 999999
Feb 16, 2005
Extension Of Time To Oppose Received
Jan 18, 2005
Published For Opposition
Dec 29, 2004
Notice Of Publication
Nov 16, 2004
Law Office Publication Review Completed
Nov 16, 2004
Assigned To Lie
Oct 27, 2004
Amendment From Applicant Entered
Oct 13, 2004
Correspondence Received In Law Office
Oct 22, 2004
Approved For Pub - Principal Register
Oct 22, 2004
Use Amendment Accepted
Oct 13, 2004
Teas Response To Office Action Received
Sep 22, 2004
Teas/Email Correspondence Entered
Jul 19, 2004
Correspondence Received In Law Office
Sep 22, 2004
Amendment To Use Processing Complete
Jul 19, 2004
Use Amendment Filed
Jul 19, 2004
Teas Amendment Of Use Received
Jul 8, 2004
Non-Final Action E-Mailed
Jun 3, 2004
Correspondence Received In Law Office
Jun 3, 2004
Correspondence Received In Law Office
Jun 3, 2004
Teas Voluntary Amendment Received
Jan 22, 2004
Non-Final Action E-Mailed
Jan 20, 2004
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
