Trademark: 78192594
Status Date
Friday, September 14, 2012
Registration Number
3057070
Registration Date
Tuesday, February 7, 2006
Filing Date
Monday, December 9, 2002
Published for Opposition
Tuesday, November 15, 2005
Cancellation Date
Friday, September 14, 2012
9 electronic laser-based ellipsometer and dark field detector used for measurement of film thickness and for surface particle inspection in the manufacture of semiconductors
The mark is presented in standard character format without claim to any particular font style, size or color.
ALL BEAM
Sep 14, 2012
Cancelled Sec. 8 (6-Yr)
Feb 7, 2006
Registered-Principal Register
Nov 15, 2005
Published For Opposition
Oct 26, 2005
Notice Of Publication
Oct 14, 2005
Attorney Review Completed
Oct 7, 2005
Attorney Review/Decision On Amendment Required
Oct 3, 2005
Petition To Director - Change Basis - Granted
Aug 9, 2005
Petition To Director - Change Basis - Received
Mar 29, 2005
Extension 1 Granted
Feb 7, 2005
Extension 1 Filed
Feb 7, 2005
Paper Received
Aug 10, 2004
Noa Mailed - Sou Required From Applicant
May 18, 2004
Published For Opposition
Apr 28, 2004
Notice Of Publication
Feb 18, 2004
Approved For Pub - Principal Register
Feb 11, 2004
Examiners Amendment Mailed
Dec 29, 2003
Correspondence Received In Law Office
Dec 29, 2003
Paper Received
Jun 25, 2003
Non-Final Action Mailed
Jun 20, 2003
Assigned To Examiner
Feb 3, 2003
Paper Received
Trademark Alertz updated from USPTO on 2030-01-24
