9 Measuring apparatus and instruments, namely, temperature sensors, temperature simulation equipment, a temperature range test module and an output module, infrared imaging units, thermometers thermocouples, and thermal analyzers for use in measuring, analyzing and diagnosis of temperature in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, semiconductor devices, electronic components and electronic assemblies composed thereof; multifunctional equipment and apparatus, namely, multi-channel digital recorders in the nature of temperature indicators incorporating voltmeters for use in measuring temperature and voltage and resistance for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices semiconductor elements, semiconductor devices, electronic components and electronic assemblies composed thereof; electrical and magnetic measuring instruments, namely, voltmeters, ammeters, digital multimeters equipped with DC voltage/current generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflectmeter, pulse pattern generator, error detector, protocol analyzer, digital spectrum analyzers, and bluetooth testers for use in measuring, analyzing and diagnosis of electronic signals, optical signals and impedance in the field of manufacturing and testing integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, semiconductor devices and electronic components and assemblies thereof; laser diode test system, namely, meters and testers for use in the analyzing and testing of laser beams comprised primarily of mainframes consisting of display and optical units, connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters wave-noise figure meters, and electronic instruments for testing bit error rates; electronic testing machines for large scale integrated circuits and semiconductors, and parts and accessories thereof; namely, electronic machines and apparatus equipped with test handlers in the nature of test handlers and integrated circuit handlers for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, integrated circuit devices, semiconductor elements, and semiconductor devices in the field of manufacturing and testing LSI (Large Scale Integrated Circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated Circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beamTest System; computer software for use in testing machines for large-scale integrated circuits and semiconductors and parts and accessories thereof
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