Trademark: 78018887
Word
PROBE POLISH
Status
Dead
Status Code
602
Status Date
Monday, September 24, 2001
Serial Number
78018887
Mark Type
1000
Filing Date
Saturday, July 29, 2000
Abandoned Date
Tuesday, July 24, 2001

Trademark Owner History

Classifications
9 clean devices used to test integrated circuits during the manufacturing process Testing occurs during wafer sort through final package testing

Trademark Events
Sep 24, 2001
Abandonment - Failure To Respond Or Late Response
Jan 23, 2001
Non-Final Action Mailed
Dec 27, 2000
Assigned To Examiner

Trademark Alertz updated from USPTO on 2030-01-24