Trademark: 76587121
Word
HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).
Status Date
Friday, March 8, 2013
Registration Number
3124041
Registration Date
Tuesday, August 1, 2006
Filing Date
Wednesday, April 14, 2004
Published for Opposition
Tuesday, September 13, 2005
Cancellation Date
Friday, March 8, 2013
9 Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and an in-situ imaging objective with mounting means attached to a framework in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the sufraces of wafers for use in manufacturing of integrated circuits
"High Accuracy Source Metrology Instrument"
Mar 8, 2013
Cancelled Sec. 8 (6-Yr)
Aug 1, 2006
Registered-Principal Register
Jun 14, 2006
Law Office Registration Review Completed
Jun 9, 2006
Assigned To Lie
Jun 3, 2006
Allowed Principal Register - Sou Accepted
Apr 27, 2006
Statement Of Use Processing Complete
Mar 22, 2006
Use Amendment Filed
Mar 22, 2006
Paper Received
Dec 6, 2005
Noa Mailed - Sou Required From Applicant
Sep 13, 2005
Published For Opposition
Aug 24, 2005
Notice Of Publication
May 18, 2005
Law Office Publication Review Completed
May 13, 2005
Assigned To Lie
May 6, 2005
Approved For Pub - Principal Register
May 5, 2005
Teas/Email Correspondence Entered
Apr 21, 2005
Correspondence Received In Law Office
Apr 21, 2005
Teas Response To Office Action Received
Nov 19, 2004
Non-Final Action E-Mailed
Nov 19, 2004
Non-Final Action Written
Nov 4, 2004
Assigned To Examiner
May 7, 2004
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
