Trademark: 76574016
Word
SOURCE METROLOGY INSTRUMENT (SMI)
Status Date
Friday, January 11, 2013
Registration Number
3101233
Registration Date
Tuesday, June 6, 2006
Filing Date
Friday, January 16, 2004
Published for Opposition
Tuesday, June 21, 2005
Cancellation Date
Friday, January 11, 2013
9 Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits
"Source Metrology Instrument"
Jan 11, 2013
Cancelled Sec. 8 (6-Yr)
Jun 6, 2006
Registered-Principal Register
Apr 20, 2006
Law Office Registration Review Completed
Apr 14, 2006
Assigned To Lie
Apr 12, 2006
Allowed Principal Register - Sou Accepted
Mar 24, 2006
Teas/Email Correspondence Entered
Mar 8, 2006
Correspondence Received In Law Office
Mar 8, 2006
Teas Response To Office Action Received
Feb 24, 2006
Non-Final Action E-Mailed
Feb 24, 2006
Su - Non-Final Action - Written
Feb 23, 2006
Statement Of Use Processing Complete
Jan 30, 2006
Use Amendment Filed
Jan 30, 2006
Paper Received
Sep 13, 2005
Noa Mailed - Sou Required From Applicant
Jun 21, 2005
Published For Opposition
Jun 1, 2005
Notice Of Publication
Mar 3, 2005
Law Office Publication Review Completed
Mar 1, 2005
Assigned To Lie
Feb 23, 2005
Approved For Pub - Principal Register
Feb 17, 2005
Amendment From Applicant Entered
Feb 3, 2005
Correspondence Received In Law Office
Feb 3, 2005
Teas Response To Office Action Received
Aug 7, 2004
Non-Final Action E-Mailed
Aug 6, 2004
Assigned To Examiner
Feb 19, 2004
New Application Entered In Tram
Trademark Alertz updated from USPTO on 2030-01-24
