Trademark: 76535673
Word
TECHNOS
Status Date
Monday, May 12, 2014
Registration Number
2918548
Registration Date
Tuesday, January 18, 2005
Filing Date
Friday, August 8, 2003
Published for Opposition
Tuesday, October 26, 2004
Cancellation Date
Monday, May 12, 2014
9 NON-MEDICAL, SCIENTIFIC, LABORATORY AND PRODUCTION DETECTION DEVICES WHICH USE X-RAY REFLECTION FLUORESCENCE ANALYZING TECHNOLOGY AND X-RAY ABSORPTION-EDGE FINE STRUCTURE TECHNOLOGY FOR USE IN THE SEMICONDUCTOR, CATALYST CHEMISTRY, MATERIAL CHEMISTRY AND BIOCHEMISTRY INDUSTRIES WHICH ALLOW THE DETECTION, MEASUREMENT, ANALYSIS AND EVALUATION OF FILM THICKNESS OF PROPERTIES AND METALLIC CONTAMINATION ON WAFER SURFACES
May 12, 2014
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Jan 18, 2005
Registered-Principal Register
Oct 26, 2004
Published For Opposition
Oct 6, 2004
Notice Of Publication
Aug 26, 2004
Law Office Publication Review Completed
Aug 17, 2004
Assigned To Lie
Aug 11, 2004
Approved For Pub - Principal Register
Aug 4, 2004
Teas/Email Correspondence Entered
Jul 29, 2004
Correspondence Received In Law Office
Jul 29, 2004
Teas Response To Office Action Received
Apr 28, 2004
Final Refusal Mailed
Mar 29, 2004
Correspondence Received In Law Office
Mar 29, 2004
Paper Received
Mar 5, 2004
Non-Final Action Mailed
Feb 27, 2004
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
