Trademark: 76533563
Status Date
Sunday, September 2, 2007
Filing Date
Wednesday, July 30, 2003
Published for Opposition
Tuesday, December 7, 2004
Abandoned Date
Sunday, September 2, 2007
9 Inspection apparatus used for evaluating thin film parameters and critical dimensions of a semiconductor wafer
Dec 7, 2007
Abandonment Notice Mailed - No Use Statement Filed
Dec 7, 2007
Abandonment - No Use Statement Filed
Feb 5, 2007
Extension 4 Granted
Feb 5, 2007
Extension 4 Filed
Feb 5, 2007
Teas Extension Received
Nov 24, 2006
Extension 3 Granted
Sep 1, 2006
Extension 3 Filed
Nov 10, 2006
Extension Received With Teas Petition
Nov 10, 2006
Petition To Revive-Granted
Nov 10, 2006
Teas Petition To Revive Received
Nov 9, 2006
Abandonment Notice Mailed - No Use Statement Filed
Nov 9, 2006
Abandonment - No Use Statement Filed
Feb 8, 2006
Extension 2 Granted
Jan 19, 2006
Extension 2 Filed
Jan 19, 2006
Teas Extension Received
Apr 5, 2005
Extension 1 Granted
Apr 5, 2005
Extension 1 Filed
Apr 5, 2005
Teas Extension Received
Mar 1, 2005
Noa Mailed - Sou Required From Applicant
Dec 7, 2004
Published For Opposition
Nov 17, 2004
Notice Of Publication
Oct 4, 2004
Law Office Publication Review Completed
Sep 29, 2004
Assigned To Lie
Sep 20, 2004
Approved For Pub - Principal Register
Sep 2, 2004
Amendment From Applicant Entered
Aug 16, 2004
Correspondence Received In Law Office
Aug 16, 2004
Paper Received
May 13, 2004
Teas Change Of Correspondence Received
Feb 18, 2004
Non-Final Action Mailed
Feb 17, 2004
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
