Word

Status

Dead

Status Code

710

Status Date

Friday, April 29, 2011

Serial Number

76468265

Registration Number

2888314

Registration Date

Tuesday, September 28, 2004

Mark Type

2000

Filing Date

Wednesday, November 13, 2002

Published for Opposition

Tuesday, February 17, 2004

Cancellation Date

Friday, April 29, 2011

Trademark Owner History

ADVANTEST CORPORATION -
SEMICONDUCTOR TEST CONSORTIUM, INC. -
Advantest Corporation - Original Registrant

Classifications

7 Semiconductor manufacturing machines and systems composed of semiconductor wafer processing machines and semiconductor substrates manufacturing machines; machine elements, not for land vehicles, namely, starters for motors and engines, AC motors and DC motors; AC generators, DC generators, and dynamo brushes

9 Measuring or testing machines and instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of temperature; multifunctional equipment and apparatus for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed of multi-channel digital recorders; electronic and magnetic measuring and testing instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, namely, current, voltage, impedance, and frequency in the field of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed of digital multimeters equipped with DC voltage/current generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain reflect meters, frequency counters, pulse pattern generators, error detectors, protocol analyzers, digital spectrum analyzers, blue tooth testers, laser diode test systems; electronic machines and apparatus, including equipped with test handlers, for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements and other semiconductor devices in the field of manufacturing or testing the foregoing, namely, LSI (Large Scale Integrated circuits) and VSLI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash Memory Test System, RFIC (Radio Frequency Integrated Circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Image sensor Test System, E-beam Test System; computer software used in connection with such machines, apparatus and instruments, namely, computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for use in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; telecommunication machines and apparatus, namely, recorded video discs and video tapes featuring information in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; downloadable electronic publications in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof

37 Installation, electrical wiring services of measuring or testing machines and elements, electronic and magnetic measuring and testing instruments, namely, electronic machines and apparatus for use in testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and other construction; consultancy in the field of installation and electrical wiring of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, and other construction; repair and maintenance of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; repair and maintenance of semiconductor manufacturing machines and systems; repair and maintenance of telecommunication machines and apparatus

42 Computer software design and testing, analyzing and diagnosis integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof in the fields of manufacturing and testing the foregoing; technical advise relating to performance, operation of computers, and other machines that require high levels of personal knowledge, skill or experience of the operators to meet the required accuracy in operating them for use in manufacturing and testing, analyzing and diagnosis integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof testing or research on measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, rental and leasing services for semiconductor manufacturing machines and systems, rental and leasing services for measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductors devices; rental and leasing services for computer (including computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for use in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof); preparation of computer software operating manuals for others in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof

The mark consists of a geometric design comprised of squares, rectangles, and other geometric shapes.

Trademark Events

Apr 29, 2011

Cancelled Sec. 8 (6-Yr)

Oct 28, 2009

Automatic Update Of Assignment Of Ownership

Oct 21, 2009

Automatic Update Of Assignment Of Ownership

Sep 28, 2004

Registered-Principal Register

Jul 29, 2004

Sec. 1(B) Claim Deleted

Jul 29, 2004

Notice Of Allowance Cancelled

Jul 29, 2004

Paper Received

May 11, 2004

Noa Mailed - Sou Required From Applicant

Feb 17, 2004

Published For Opposition

Jan 28, 2004

Notice Of Publication

Dec 4, 2003

Approved For Pub - Principal Register

Nov 18, 2003

Correspondence Received In Law Office

Nov 18, 2003

Paper Received

May 20, 2003

Non-Final Action Mailed

May 15, 2003

Assigned To Examiner

Jan 24, 2003

Paper Received