Trademark: 76466035
Status Date
Wednesday, March 10, 2004
Filing Date
Friday, November 8, 2002
Published for Opposition
Tuesday, June 17, 2003
Abandoned Date
Wednesday, March 10, 2004
9 Laser scanners and reflectometers for industrial inspection, namely metrology modules employing optical measuring techniques, particularly reflectometry and laser profiling to non-destructively monitor the surface profiles of samples of semiconductor wafers, flat panel displays and magnetic media
Jun 23, 2004
Abandonment - No Use Statement Filed
Sep 9, 2003
Noa Mailed - Sou Required From Applicant
Jun 17, 2003
Published For Opposition
May 28, 2003
Notice Of Publication
Apr 7, 2003
Paper Received
Apr 16, 2003
Approved For Pub - Principal Register
Apr 1, 2003
Correspondence Received In Law Office
Mar 26, 2003
Non-Final Action E-Mailed
Mar 20, 2003
Assigned To Examiner
Mar 20, 2003
Assigned To Examiner
Dec 12, 2002
Paper Received
Trademark Alertz updated from USPTO on 2030-01-24