Trademark: 76444643
Status Date
Thursday, December 18, 2003
Filing Date
Monday, August 26, 2002
Published for Opposition
Tuesday, March 25, 2003
Abandoned Date
Thursday, December 18, 2003
9 combination of optical metrology instruments for measuring such things as microscopic dimensions and film thickness features of samples, particularly, of semiconductor wafers, flat panel displays and magnetic media
May 25, 2004
Abandonment - No Use Statement Filed
May 17, 2004
Case File In Ticrs
Jun 17, 2003
Noa Mailed - Sou Required From Applicant
Mar 25, 2003
Published For Opposition
Mar 5, 2003
Notice Of Publication
Jan 23, 2003
Approved For Pub - Principal Register
Jan 10, 2003
Assigned To Examiner
Oct 15, 2002
Paper Received
Trademark Alertz updated from USPTO on 2030-01-24