9 X-ray sources, namely, vacuum tubes for accelerating electrons into an anode for generating x-ray radiation; x-ray systems comprising x-ray sources, optics, power supplies, cooling fans, heat-sinks, thermo-electric cooling devices, and gas or fluid cooling devices for conduction, convection, or radiation cooling sold as a unit for raw material, manufactured material and manufactured component phase, stress or element analysis; x-ray tubes, namely, tubes comprising a filament and anode mounted in a vacuum housing and a power supply for accelerating electrons emitted by such filament into the anode; x-ray detectors; x-ray detection systems comprising a photon counter, a charge coupled device being a semiconductor device that stores and transfers electrical charge, a micro-channel plate, a scintillator, and a phosphor or negative electron affinity counter sold as a unit for raw material, manufactured material and manufactured component phase, stress or element analysis; x-ray collimating lenses; x-ray collimating lens systems comprising optical capillaries, phase plates or single crystals sold as a unit for phase, stress or element analysis; electronic components for x-ray detectors and detection systems, namely x-ray tubes, power supplies, and x-ray detectors; diffractometers for analysis of inorganic and organic substances; diffractometers for thin film analysis; diffractometers for analysis of semiconductor materials and electronic devices; diffractometers for element alanalysis; synchrontonic equipment, namely, electron beam focusing devices comprising an x-ray source, magnets and power supply for accelerating electrons within an annular vacuum tube; x-ray protein analysis apparatus, namely, spectrometers, diffractometers, chromatographs and crystallographs; x-raychromato graph apparatus, namely, x-ray chromatographs; x-ray imaging microscope and inspection systems comprising an x-ray source, detector, optics and sample mounting stage sold as a unit for raw material, manufactured material and manufactured component phase, stress or element analysis; x-ray industrial computer tomographic equipment, namely, computer tomographic systems comprising an x-ray source, detector, optics and sample mounting stage sold as a unit; x-ray lithographic systems comprising an x-ray source, detector, optics and sample mounting stage sold as a unit for exposing lithographic resist in the fabrication of electronic components; goniometers for x-ray equipment
Trademark: 76384328
