Trademark: 76342051
Status Date
Friday, May 30, 2003
Filing Date
Monday, November 26, 2001
Abandoned Date
Saturday, April 19, 2003
9 Semiconductor wafer gauge structures having known dimensional properties to be used in place of semiconductor wafers for the purpose of calibrating semiconductor wafer non-contact dimensional measurement devices
May 30, 2003
Abandonment - Failure To Respond Or Late Response
Oct 18, 2002
Final Refusal Mailed
Sep 5, 2002
Correspondence Received In Law Office
Sep 5, 2002
Paper Received
Mar 1, 2002
Non-Final Action Mailed
Feb 14, 2002
Assigned To Examiner
Feb 12, 2002
Assigned To Examiner
Feb 11, 2002
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24