Trademark: 76327744
Status Date
Friday, March 22, 2013
Registration Number
2609693
Registration Date
Tuesday, August 20, 2002
Filing Date
Friday, October 19, 2001
Published for Opposition
Tuesday, May 28, 2002
Cancellation Date
Friday, March 22, 2013
9 Apparatus for measurement of silicon wafer thickness, flatness and shape
Mar 22, 2013
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Aug 26, 2009
Automatic Update Of Assignment Of Ownership
Aug 19, 2009
Automatic Update Of Assignment Of Ownership
Sep 2, 2008
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Aug 28, 2008
Assigned To Paralegal
Aug 20, 2008
Teas Section 8 & 15 Received
Nov 20, 2007
Case File In Ticrs
Mar 28, 2007
Teas Change Of Correspondence Received
Aug 20, 2002
Registered-Principal Register
May 28, 2002
Published For Opposition
May 8, 2002
Notice Of Publication
Jan 17, 2002
Approved For Pub - Principal Register
Jan 8, 2002
Examiner's Amendment Mailed
Dec 17, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24