Trademark: 76272994
Status Date
Friday, October 19, 2012
Registration Number
2547288
Registration Date
Tuesday, March 12, 2002
Filing Date
Monday, June 18, 2001
Published for Opposition
Tuesday, December 18, 2001
Cancellation Date
Friday, October 19, 2012
9 OPTICAL SYSTEM FOR MEASURING THE CURVATURE OF A SEMICONDUCTOR WAFER, COMPOSED OF A LIGHT SOURCE AND A DETECTOR AND A PROCESSOR FOR CALCULATING THE CURVATURE OF THE WAFER AND DETERMINING THE STRESS IN A FILM DEPOSITED ON THE WAFER
Oct 19, 2012
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Jun 10, 2009
Automatic Update Of Assignment Of Ownership
Jun 20, 2007
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Jun 8, 2007
Assigned To Paralegal
May 14, 2007
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
May 14, 2007
Paper Received
Mar 27, 2007
Case File In Ticrs
Mar 12, 2002
Registered-Principal Register
Dec 18, 2001
Published For Opposition
Nov 28, 2001
Notice Of Publication
Aug 29, 2001
Approved For Pub - Principal Register
Aug 21, 2001
Examiner's Amendment Mailed
Aug 9, 2001
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
