Word

Status

Dead

Status Code

710

Status Date

Friday, January 28, 2011

Serial Number

76149163

Registration Number

2856240

Registration Date

Tuesday, June 22, 2004

Mark Type

2000

Filing Date

Wednesday, October 18, 2000

Published for Opposition

Tuesday, October 1, 2002

Cancellation Date

Friday, January 28, 2011

Trademark Owner History

nLine Corporation - Original Registrant

Classifications

9 Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors

37 Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes

40 Custom manufacture and design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes

42 On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes

Trademark Events

Jan 28, 2011

Cancelled Sec. 8 (6-Yr)

Jun 22, 2004

Registered-Principal Register

Mar 22, 2004

Allowed Principal Register - Sou Accepted

Mar 17, 2004

Assigned To Examiner

Mar 15, 2004

Case File In Ticrs

Mar 10, 2004

Statement Of Use Processing Complete

Nov 3, 2003

Use Amendment Filed

Mar 10, 2004

Extension 1 Granted

Jun 24, 2003

Extension 1 Filed

Mar 4, 2004

Petition To Revive-Granted

Oct 24, 2003

Petition To Revive-Received

Nov 3, 2003

Paper Received

Oct 24, 2003

Paper Received

Sep 12, 2003

Abandonment - No Use Statement Filed

Dec 24, 2002

Noa Mailed - Sou Required From Applicant

Oct 1, 2002

Published For Opposition

Sep 11, 2002

Notice Of Publication

Aug 7, 2002

Previous Allowance Count Withdrawn

May 29, 2002

Approved For Pub - Principal Register

Mar 25, 2002

Correspondence Received In Law Office

Mar 25, 2002

Paper Received

Sep 24, 2001

Final Refusal Mailed

Jun 11, 2001

Correspondence Received In Law Office

Apr 19, 2001

Non-Final Action Mailed

Apr 1, 2001

Assigned To Examiner

Mar 14, 2001

Assigned To Examiner