Trademark: 76074286
Status Date
Saturday, August 8, 2009
Registration Number
2669787
Registration Date
Tuesday, December 31, 2002
Filing Date
Tuesday, June 20, 2000
Published for Opposition
Tuesday, March 19, 2002
Cancellation Date
Saturday, August 8, 2009
9 RADIATION BASED INSPECTION EQUIPMENT, NAMELY, SPECTROMETERS, ELLIPSOMETERS, X-RAY REFLECTOMETERS AND THERMAL AND PLASMA WAVE METROLOGY INSTRUMENTS, FOR USE IN INSPECTING SEMICONDUCTOR WAFERS WHILE INSIDE A PROCESSING TOOL
Aug 8, 2009
Cancelled Sec. 8 (6-Yr)
Jun 10, 2009
Automatic Update Of Assignment Of Ownership
Jan 3, 2008
Case File In Ticrs
Dec 31, 2002
Registered-Principal Register
Oct 24, 2002
Allowed Principal Register - Sou Accepted
Sep 27, 2002
Statement Of Use Processing Complete
Jul 25, 2002
Use Amendment Filed
Jul 26, 2002
Paper Received
Jul 8, 2002
Extension 1 Granted
Jun 24, 2002
Extension 1 Filed
Jun 24, 2002
Paper Received
Jun 11, 2002
Noa Mailed - Sou Required From Applicant
Mar 19, 2002
Published For Opposition
Feb 27, 2002
Notice Of Publication
Nov 28, 2001
Approved For Pub - Principal Register
Nov 28, 2001
Assigned To Examiner
Jul 12, 2001
Correspondence Received In Law Office
Jan 25, 2001
Non-Final Action Mailed
Jan 25, 2001
Assigned To Examiner
Dec 29, 2000
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
