Trademark: 75673568
Status Date
Saturday, July 11, 2009
Registration Number
2657305
Registration Date
Tuesday, December 3, 2002
Filing Date
Friday, April 2, 1999
Published for Opposition
Tuesday, December 7, 1999
Cancellation Date
Saturday, July 11, 2009
9 MEASUREMENT DEVICES FOR CHARACTERIZING SUBSTRATES, PARTICULARLY SEMICONDUCTOR WAFERS; MEASUREMENT DEVICES FOR MEASURING THICKNESS OF SEMICONDUCTOR WAFERS
Jul 11, 2009
Cancelled Sec. 8 (6-Yr)
Feb 28, 2008
Case File In Ticrs
May 26, 2005
Teas Change Of Correspondence Received
Dec 3, 2002
Registered-Supplemental Register
Sep 18, 2002
Approved For Registration Supplemental Register
Sep 18, 2002
Use Amendment Accepted
Jul 18, 2002
Correspondence Received In Law Office
Jul 18, 2002
Paper Received
Jul 30, 2002
Amendment To Use Processing Complete
Jul 9, 2002
Use Amendment Filed
Jul 9, 2002
Correspondence Received In Law Office
Jul 9, 2002
Paper Received
Apr 12, 2002
Non-Final Action Mailed
Feb 25, 2002
Correspondence Received In Law Office
Sep 10, 2001
Final Refusal Mailed
Jul 6, 2001
Correspondence Received In Law Office
Jul 6, 2001
Correspondence Received In Law Office
May 22, 2001
Assigned To Examiner
May 22, 2001
Assigned To Examiner
Jan 3, 2001
Non-Final Action Mailed
Jan 2, 2001
Previous Allowance Count Withdrawn
Dec 7, 1999
Published For Opposition
Nov 5, 1999
Notice Of Publication
Sep 20, 1999
Approved For Pub - Principal Register
Sep 16, 1999
Examiner's Amendment Mailed
Sep 15, 1999
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
