Trademark: 75594997
Status Date
Saturday, January 12, 2002
Filing Date
Tuesday, December 1, 1998
Published for Opposition
Tuesday, October 19, 1999
Abandoned Date
Saturday, April 20, 2002
9 Optical and Charged particle diagnostic equipment for the inspection, review and measurement of semiconductor elements in the nature of wafers, reticles, and flat panel displays
Apr 20, 2002
Abandonment - No Use Statement Filed
Jul 23, 2001
Extension 3 Granted
Jul 6, 2001
Extension 3 Filed
Feb 15, 2001
Extension 2 Granted
Jan 10, 2001
Extension 2 Filed
Aug 27, 2000
Extension 1 Granted
Jul 5, 2000
Extension 1 Filed
Jan 11, 2000
Noa Mailed - Sou Required From Applicant
Oct 19, 1999
Published For Opposition
Sep 17, 1999
Notice Of Publication
Jul 1, 1999
Approved For Pub - Principal Register
Jun 21, 1999
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24