9 Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, [ electrical conductivity, ] ferrite content, micro-harness, and other properties of coatings and layers; [ magneto-, opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; thickness measurement instruments that use ultra sound ] and electromagnetic radiation for measurement of diffraction refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results