9 Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto, -opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [ thickness measurement instruments that use ultra sound ] and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results