9 Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments], instruments for measuring thickness of coatings, alloy compositions, material analysis, [porosity, electrical conductivity,] ferrite content, [ micro-hardness,] and other properties of coatings and layers;[ magneto,-opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use ultra sound and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results