Trademark: 75486723
Word
EPIC
Status
Dead
Status Code
602
Status Date
Tuesday, February 29, 2000
Serial Number
75486723
Mark Type
1000
Filing Date
Monday, May 18, 1998
Abandoned Date
Monday, November 15, 1999
Trademark Owner History
Nanometrics Incorporated
Classifications
9 metrology system for the analysis and determination of properties such as thickness and optical constants of films on samples such as semiconductor wafers using different optical technologies for film analysis such as Fourier Transform Infrared (FTIR), visible and ultraviolet (UV) reflectometry
Trademark Events
Feb 29, 2000
Abandonment - Failure To Respond Or Late Response
May 14, 1999
Final Refusal Mailed
Mar 22, 1999
Correspondence Received In Law Office
Jan 13, 1999
Non-Final Action Mailed
Dec 30, 1998
Assigned To Examiner
TUSHNIC'S
CLOSESURE
Trademark Alertz updated from USPTO on 2030-01-24

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