Trademark: 75457537
Status Date
Friday, October 8, 2010
Registration Number
2325286
Registration Date
Tuesday, March 7, 2000
Filing Date
Thursday, March 26, 1998
Published for Opposition
Tuesday, December 14, 1999
Cancellation Date
Friday, October 8, 2010
9 measuring system comprising computer hardware and software for measuring film thickness, namely, EPI thickness, transition layer thickness and substrate carrier concentration of semiconductor wafers
Oct 8, 2010
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Aug 26, 2009
Automatic Update Of Assignment Of Ownership
Aug 19, 2009
Automatic Update Of Assignment Of Ownership
Mar 28, 2007
Teas Change Of Correspondence Received
May 13, 2006
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
May 8, 2006
Case File In Ticrs
May 5, 2006
Assigned To Paralegal
Feb 8, 2006
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
Feb 8, 2006
Paper Received
Mar 7, 2000
Registered-Principal Register
Dec 14, 1999
Published For Opposition
Nov 12, 1999
Notice Of Publication
Aug 17, 1999
Approved For Pub - Principal Register
Jun 9, 1999
Correspondence Received In Law Office
Dec 7, 1998
Non-Final Action Mailed
Nov 17, 1998
Assigned To Examiner
Nov 3, 1998
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
