Trademark: 75456822
Status Date
Saturday, October 14, 2006
Registration Number
2307925
Registration Date
Tuesday, January 11, 2000
Filing Date
Thursday, March 26, 1998
Published for Opposition
Tuesday, March 16, 1999
Cancellation Date
Saturday, October 14, 2006
9 Software for use in measuring and analyzing flatness of substrates, particularly semiconductor wafers, and more particularly for lithographic, CMP process development and optimization of positioning
Oct 14, 2006
Cancelled Sec. 8 (6-Yr)
May 25, 2006
Case File In Ticrs
Jan 11, 2000
Registered-Principal Register
Oct 21, 1999
Allowed Principal Register - Sou Accepted
Jul 29, 1999
Statement Of Use Processing Complete
Jul 29, 1999
Use Amendment Filed
Jun 8, 1999
Noa Mailed - Sou Required From Applicant
Mar 16, 1999
Published For Opposition
Feb 12, 1999
Notice Of Publication
Nov 17, 1998
Approved For Pub - Principal Register
Nov 5, 1998
Assigned To Examiner
Oct 29, 1998
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24