Trademark: 75456781
Status Date
Saturday, March 8, 2008
Registration Number
2455732
Registration Date
Tuesday, May 29, 2001
Filing Date
Thursday, March 26, 1998
Published for Opposition
Tuesday, November 9, 1999
Cancellation Date
Saturday, March 8, 2008
9 System comprising computer hardware and software for measuring substrate characteristics, namely, for measuring semiconductor wafer characteristics
Mar 8, 2008
Cancelled Sec. 8 (6-Yr)
Oct 18, 2006
Case File In Ticrs
May 29, 2001
Registered-Principal Register
Mar 8, 2001
Allowed Principal Register - Sou Accepted
Mar 7, 2001
Assigned To Examiner
Mar 4, 2001
Statement Of Use Processing Complete
Feb 1, 2001
Use Amendment Filed
Sep 27, 2000
Extension 1 Granted
Jul 28, 2000
Extension 1 Filed
Feb 1, 2000
Noa Mailed - Sou Required From Applicant
Nov 9, 1999
Published For Opposition
Oct 8, 1999
Notice Of Publication
Jul 6, 1999
Approved For Pub - Principal Register
May 24, 1999
Correspondence Received In Law Office
Nov 24, 1998
Non-Final Action Mailed
Oct 29, 1998
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24