Trademark: 75456776
Word
GALAXY AWIS - 300
Status
Dead
Status Code
602
Status Date
Wednesday, March 1, 2000
Serial Number
75456776
Mark Type
1000
Filing Date
Thursday, March 26, 1998
Abandoned Date
Friday, December 31, 1999

Trademark Owner History

Classifications
9 Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks

Trademark Events
Mar 1, 2000
Abandonment - Failure To Respond Or Late Response
Jun 30, 1999
Final Refusal Mailed
May 13, 1999
Correspondence Received In Law Office
Nov 9, 1998
Non-Final Action Mailed
Oct 29, 1998
Assigned To Examiner

Trademark Alertz updated from USPTO on 2030-01-24