Trademark: 75446145
Status Date
Wednesday, August 2, 2000
Filing Date
Friday, March 6, 1998
Published for Opposition
Tuesday, November 9, 1999
Abandoned Date
Wednesday, August 2, 2000
9 Scientific instrument for metrology applications, namely, a metrology unit which is used to measure the critical dimensions and overlay registration achieved in submicron optical lithography
Oct 23, 2000
Abandonment - No Use Statement Filed
Feb 1, 2000
Noa Mailed - Sou Required From Applicant
Nov 9, 1999
Published For Opposition
Oct 8, 1999
Notice Of Publication
Jun 11, 1999
Approved For Pub - Principal Register
Jun 8, 1999
Examiner's Amendment Mailed
Dec 21, 1998
Correspondence Received In Law Office
Dec 8, 1998
Non-Final Action Mailed
Nov 13, 1998
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24